Explore how scientists use PMMA thin films and spectroscopic ellipsometry to study materials thinner than a human hair that power modern technology.
Discover how Variable-Angle Spectroscopic Ellipsometry reveals the hidden microstructure of porous silicon, enabling breakthroughs in biomedical and energy technologies.
Exploring how UV-NIR spectroscopic ellipsometry enables sensitivity analysis for next-generation OMOG and EUV photomasks in semiconductor manufacturing.